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Mots clés
Adsorption
Gallium oxide
Pb centers
Growth
Silicon carbide
ALD
27Ald p&α
Photoluminescence
Nuclear reaction analysis
8140Ef
Magnetic semiconductors
Isotopic Tracing
17O
ADSORPTION DESORPTION HYSTERESIS
Nickel
Hysteresis
27Alda
Nanostructures
Density functional theory
HfO2
Diffusion
Ion implantation
AFM
AC susceptibility
Thin films
7550Pp
Nuclear resonance profiling NRP
Defects
EPR
Annealing
XPS
Epitaxy
Adsorbed layers
SiC
Alloy
Transparent conductive oxide TCO
13C
Atomic Layer Deposition ALD
17Op
Auger electron spectroscopy AES
7550Ee
Acoustic
XRD
Raman spectroscopy
Aluminum
Multilayer
18O
Periodic multilayer
Low energy electron diffraction LEED
Nitridation
17Opp
Ageing
Epitaxial growth
Thin film
27Aldp
Interface defects
2H
Nanoparticles
Measurement
Metal-insulator transition
Magnetization curves
Ferromagnetic resonance
Aluminium
Capillary condensation
Rutherford backscattering spectrometry RBS
Oxidation
Oxygen deficiency
Energy loss
Silica
Channeling
7630Lh
Stable isotopic tracing
Pulsed laser deposition
GaMnAs
15N
Silicon Carbide
Al2O3
NRP
Acoustic propreties of solid
Kossel diffraction
Zinc oxide
Silicon
6855Jk
Indium oxide
3C-SiC
Topological insulators
X-ray diffraction
Magnetic anisotropy
Topological defects
Charge exchange
Passivation
Adsorption Isotherms
PIXE
Gold
RBS
Evaluation
Alloys
Ion beam analysis
Sputtering
18O resonance